NEEM-6451  Semiconductor Material and Device Characterization (IC 714)

Note: The following provides a suggested course description, objectives, and an outline. These may be modified pending discussion with the Faculty Chairs, proposing faculty, and other curriculum reviewers.

Course Description: Most of the characterization techniques and the material or device parameters measured with these techniques are discussed. Included are electrical, optical, electron-beam, ion-beam, and x-ray techniques.

 


 

 




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